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Connector use life prediction
Created:2014-6-18 11:59:03  |  Views:68

Abstract:

Connector life is measured connector performance reliability of the primary indicators, as people on electronic product trouble-free working performance requirements have been constantly enhanced, connector design to improve service life become a design guide.

Connector life is measured connector performance reliability of the primary indicators, as people on electronic product trouble-free working performance requirements have been constantly enhanced, connector design to improve service life become a design guide. In addition, the market competition intensifies also requires design personnel in the expensive alloy in search for the suitable material to reduce the cost of the connector. In many cases, these trends comprehensive results make connector of copper alloy work characteristic closer to its performance limit.

Initial contact force is connector design and material properties is an important factor. Because the contact element, the elastic deion will be converted into plastic deion, the stress release will lead to the decrease of the contact force. If contact force below a critical level, the contact element will appear function failure. Therefore, prediction as time and temperature related function of stress release natural will become the key factors to ensure the connector reliability.

Stress release data is designer forecast electronic connector use life of an effective tool, and may, according to the existing data to contact the choice of materials to make a decision. These data has been widely used in computer, communication and automotive electronics industry. But at present, the product life cycle of data is very lack of, especially in the field of computer. Not only that, it shorten product development cycle and the validity of a more useful data.

Most of the connector design researchers used stress release data is mainly according to the application requirements in order to reduce contact element material choice scope. However, many designers are also seek appropriate test method to a more accurate prediction of the service life of connector characteristics. This can greatly reduce the number of test samples and test many sample brought about by the relevant cost.

At present, the severe environment and engine hood inside car connector is used mostly 3 level and 1 design technical requirements; And the next generation of auto connector working temperature is expected to improve to. But most non auto connector don't seem to need in the above conditions maintain its stability. However, high density connector for initial plug force is low, in turn, reduced the stress release quantity. This makes stress release even in low temperature is also important characteristic. And the specific application of the test data of the required standard determination time may be difficult to determine accurately. In the use of the expected temperature, test time in 1000 h and 3000 h can be used to assess between auto electronic products feature data. All the signs are that, people have more and more attention than 3000 h is 3000 ~ 5000 h (150000 miles of life) feature data. Test data prediction (without considering the change of slope may lead to contact a life stage overrated phenomenon, and with the extension of time its high measure can increase accordingly. A specific temperature data of semi logarithmic graphics representation currently applied most widely, the most urgent need. This is a specific application of the most simple and easy methods of various materials. However, it is important to emphasize that computative data should be examined carefully, and should pay attention to the possibility of there ultimate life overvalued.


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